Steffen Meyer
发表
Arie den Boef,
Maurits van der Schaar,
Kaustuve Bhattacharyya,
2013,
Optical Metrology.
Thorsten Vaupel,
Steffen Meyer,
Jürgen Hupp,
2008
.
Arie den Boef,
Kaustuve Bhattacharyya,
Chih-Ming Ke,
2013,
ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference.
David King,
Steffen Meyer,
Jose D. Salas,
2001
.
Reinder Plug,
Pu Li,
Arie den Boef,
2014,
Advanced Lithography.
Vijay P. Singh,
Steffen Meyer,
D. K. Frevert,
2001
.
Arie den Boef,
Maurits van der Schaar,
Kaustuve Bhattacharyya,
2012,
Advanced Lithography.
Steffen Meyer,
Florent Dettoni,
Christophe Dezauzier,
2017,
Advanced Lithography.
Thorsten Vaupel,
Stephan Haimerl,
Steffen Meyer,
2011
.
Andreas Krause,
Dirk Krome,
Günter P. Merker,
2002
.
Arie den Boef,
Maurits van der Schaar,
Kaustuve Bhattacharyya,
2013,
Advanced Lithography.
Albert Li,
Maurits van der Schaar,
Kaustuve Bhattacharyya,
2011,
Advanced Lithography.