Mong-Song Liang

发表

Studies on the Percentage Variation of Resistance of Polymer Thick Film (PTF) Resistors

Shen-Li Fu, Mong-Song Liang, Toyotaro Shiramatsu, 1981 .

Global pattern density effects on low-k trench CDs for sub-65-nm technology nodes

Mong-Song Liang, K.Y.-Y. Doong, L. J. Hung, 2006, SPIE Advanced Lithography.

A 0.13 /spl mu/m CMOS technology with 193 nm lithography and Cu/low-k for high performance applications

J. Y. Cheng, Mong-Song Liang, Hun-Jan Tao, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

An Integrated Gate Stack Process for Sub-90nm CMOS Technology

Mong-Song Liang, Shoou-Jinn Chang, Y. S. Tsai, 2003 .

A hot-hole erasable memory cell

Mong-Song Liang, Tien-Chiun Lee, 1986 .

5nm-gate nanowire FinFET

Chenming Hu, Yee-Chia Yeo, Mong-Song Liang, 2004, Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..

Reliability of ultrathin gate oxides for ULSI devices

Horng-Chih Lin, Tiao-Yuan Huang, Chun-Yen Chang, 1999 .

45nm node planar-SOI technology with 0.296μm2 6T-SRAM cell

Chenming Hu, Mong-Song Liang, Fu-Liang Yang, 2004, VLSIT 2004.

Pattern dependence study of copper planarization using linear polisher for 0.13 /spl mu/m applications

Mong-Song Liang, S. M. Jang, L. K. Huang, 2001, Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461).

Mechanism of device instability for unhydrogenated polysilicon TFTs under off-state stress

Dun-Nian Yaung, Mong-Song Liang, M. Liang, 2000 .

Improvement in Leakage Current and Breakdown Field of Cu-Comb Capacitor Using a Silicon Oxycarbide Dielectric Barrier

Mong-Song Liang, Mao-Chieh Chen, Syun-Ming Jang, 2004 .

Transient Charging and Discharging Behaviors of Border Traps in the Dual-Layer $\hbox{HfO}_{2}/\hbox{SiO}_{2}$ High- $\kappa$ Gate Stack Observed by Using Low-Frequency Charge Pumping Method

Bing-Yue Tsui, Mong-Song Liang, Mao-Chieh Chen, 2007, IEEE Transactions on Electron Devices.

Plasma-induced charging damage in ultrathin (3-nm) gate oxides

Horng-Chih Lin, Tiao-Yuan Huang, Chun-Yen Chang, 2000 .

Improvement of Data Retention in Floating Gate Flash EEPROM’s with P-Doped Floating Gate

Steve S. Chung, Mong-Song Liang, D. S. Kuo, 2003 .

Downscaling limit of equivalent oxide thickness in formation of ultrathin gate dielectric by thermal-enhanced remote plasma nitridation

Chih-Wei Yang, Mong-Song Liang, Tze-Liang Lee, 2002 .

Cell-based analytic statistical model with correlated parameters for intrinsic breakdown of ultrathin oxides

Mong-Song Liang, Chin-Shan Hou, M. Liang, 1999 .

Improvement on Fluorine Effect under High Field Stress in Tungsten-Polycide Gated Metal-Oxide-Semiconductor Field-Effect Transistor with Oxynitride and/or Reoxidized-Oxynitride Gate Dielectric

Mong-Song Liang, Kan-Yuan Lee, M. Liang, 1996 .

BEOL process integration of 65nm Cu/low k interconnects

Mong-Song Liang, C.H. Yao, C.C. Jeng, 2004, Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729).

Electron trapping in very thin thermal silicon dioxides

Chenming Hu, Mong-Song Liang, C. Hu, 1981, 1981 International Electron Devices Meeting.

Degradation of very thin gate oxide MOS devices under dynamic high field/Current stress

S. Haddad, Mong-Song Liang, W. Cox, 1986, 1986 International Electron Devices Meeting.

Mechanical property analyses of porous low-dielectric-constant films for stability evaluation of multilevel-interconnect structures

Mong-Song Liang, Shou-Yi Chang, Syun-Ming Jang, 2004 .

Hf-doped and NH3-nitrided high-K gate dielectric thin film with least drain current degradation and flatband voltage shift

Chih-Wei Yang, Mong-Song Liang, Yong-Shiuan Tsair, 2003 .

Characterization of hot-hole injection induced SILC and related disturbs in flash memories

Steve S. Chung, Mong-Song Liang, Cherng-Ming Yih, 2001 .

35nm CMOS FinFETs

Chenming Hu, Mong-Song Liang, Fu-Liang Yang, 2002 .

Leakage and Breakdown Mechanisms of Cu Comb Capacitors with Bilayer-Structured α-SiCN/α-SiC Cu-Cap Barriers

Mong-Song Liang, Mao-Chieh Chen, Syun-Ming Jang, 2004 .

A physical model for hole direct tunneling current in p/sup +/ poly-gate pMOSFETs with ultrathin gate oxides

Mong-Song Liang, S. M. Jang, Ming-Chin Chang, 2000 .

Inversion-layer capacitance and mobility of very thin gate-Oxide MOSFET's

Ping-Keung Ko, Jeong Yeol Choi, Chenming Hu, 1986 .

High-Performance PMOS Devices on (110)/<111'> Substrate/Channel with Multiple Stressors

Mong-Song Liang, H.C.-H. Wang, Tze-Liang Lee, 2006, 2006 International Electron Devices Meeting.

Leakage mechanism in Cu damascene structure with methylsilane-doped low-K CVD oxide as intermetal dielectric

Mong-Song Liang, Mao-Chieh Chen, Lain-Jong Li, 2001 .

The 1.3–1.6 nm nitrided oxide prepared by NH3 nitridation and rapid thermal annealing for 0.1 μm and beyond CMOS technology application

Chih-Wei Yang, Mong-Song Liang, Yong-Shiuan Tsair, 2002 .

Electrical Characteristics of Polymer Thick Film Resistors, Part I: Experiemental Results

Shen-Li Fu, Mong-Song Liang, Toyotaro Shiramatsu, 1981 .

Effects of O2- and N2-Plasma Treatments on Copper Surface

Mong-Song Liang, Mao-Chieh Chen, Lain-Jong Li, 2004 .

New Trap-Assisted Band-to-Band Tunneling Induced Gate Current Model for P-Channel Metal-Oxide-Semiconductor Field Effect Transistors with Sub-3 nm Oxides

Ya-Chin King, Mong-Song Liang, Cheng-Jye Liu, 2001 .

A new technique for hot carrier reliability evaluations of flash memory cell after long-term program/erase cycles

Steve S. Chung, Mong-Song Liang, Shui-Ming Cheng, 1999 .

45nm Node Planar-SO1 Technology with 0.296pm2 6T-SUM Cell

Chenming Hu, Mong-Song Liang, Di-Hong Lee, 2004 .

Evaluation and Numerical Simulation of Optimal Structural Designs for Reliable Packaging of Ultra Low K Process Technology

Mong-Song Liang, C.H. Yao, M.S. Liang, 2006, 2006 International Interconnect Technology Conference.