In-Tak Cho

发表

High Performance p-type SnO thin-film Transistor with SiO x Gate Insulator Deposited by Low-Temperature PECVD Method

Sang-Hun Song, Jong-Ho Lee, Hyuck-In Kwon, 2014 .

Full-Swing InGaZnO Thin Film Transistor Inverter with Depletion Load

Hyuck-In Kwon, Jong-Ho Lee, In-Tak Cho, 2009 .

Water-soluble thin film transistors and circuits based on amorphous indium-gallium-zinc oxide.

John A Rogers, Ha Uk Chung, Sang Youn Han, 2015, ACS applied materials & interfaces.

Thermoreflectance microscopy analysis on self-heating effect of short-channel amorphous In-Ga-Zn-O thin film transistors

Hyuck-In Kwon, Jong-Ho Lee, Ki Soo Chang, 2014 .

Low-Frequency Noise in Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistors

Hyuck-In Kwon, Jong-Ho Lee, Chi-Sun Hwang, 2009, IEEE Electron Device Letters.

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

Hyuck-In Kwon, Jong-Ho Lee, In-Tak Cho, 2008 .

Conduction and Low-Frequency Noise Analysis in $ \hbox{Al}/\alpha\hbox{-TiO}_{X}/\hbox{Al}$ Bipolar Switching Resistance Random Access Memory Devices

Hyuck-In Kwon, Jong-Ho Lee, Sung-Yool Choi, 2010, IEEE Electron Device Letters.

Solution-processed single-walled carbon nanotube field effect transistors and bootstrapped inverters for disintegratable, transient electronics

Sang Youn Han, John A. Rogers, Jong-Ho Lee, 2014 .

Full-Swing a-IGZO Inverter With a Depletion Load Using Negative Bias Instability Under Light Illumination

Hyungcheol Shin, Byung-Gook Park, Hyuck-In Kwon, 2012, IEEE Electron Device Letters.

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Hyuck-In Kwon, Jong-Ho Lee, In-Tak Cho, 2008 .

Effect of Temperature and Electric Field on Degradation in Amorphous InGaZnO TFTs Under Positive Gate and Drain Bias Stress

Hyuck-In Kwon, Jong-Ho Lee, Sung-Min Joe, 2014, IEEE Electron Device Letters.