Reiner W. Kuehl

Stability of thin film resistors - Prediction and differences base on time-dependent Arrhenius law

Reiner W. Kuehl, R. W. Kuehl, 2009, Microelectron. Reliab..

Influence of bias humidity testing and application on time-dependent, Arrhenius-law-based stability predictions for thin film resistors

Reiner W. Kuehl, R. W. Kuehl, 2014, Microelectron. Reliab..

Reliability of thin-film resistors: impact of third harmonic screenings

Reiner W. Kuehl, 2002, Microelectron. Reliab..