S. Griep

Key attributes of an SRAM testing strategy required for effective process monitoring

D. Schmitt-Landsiedel, J. Khare, S. Griep, 1993, Records of the 1993 IEEE International Workshop on Memory Testing.

Design based failure analysis and yield improvement in CMOS-circuits

Doris Keitel-Schulz, S. Griep, Doris Dr Schmitt-Landsiedel, 1996 .

Critical area analysis for design-based yield improvement of VLSI circuits

Wojciech Maly, J. Khare, S. Griep, 1995 .

SRAM-based extraction of defect characteristics

Wojciech Maly, J. Khare, S. Griep, 1994, Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures.

Yield-oriented computer-aided defect diagnosis

Wojciech Maly, J. Khare, S. Griep, 1995 .

Application of defect simulation as a tool for more efficient failure analysis

Wojciech Maly, J. Khare, S. Griep, 1994 .