H.-D. Oberle

Key attributes of an SRAM testing strategy required for effective process monitoring

D. Schmitt-Landsiedel, J. Khare, S. Griep, 1993, Records of the 1993 IEEE International Workshop on Memory Testing.

Enhanced fault modeling for DRAM test and analysis

Peter Muhmenthaler, H.-D. Oberle, M. Maue, 1991, Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's.

Fast automatic failbit analysis for DRAMs

H.-D. Oberle, W. Mohr, W. Malzfeldt, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM

Peter Muhmenthaler, H.-D. Oberle, 1991, 1991, Proceedings. International Test Conference.

Electrical characterization of megabit DRAMs. 1. External testing

H.-D. Oberle, G. Antonin, J. Kolzer, 1991 .