D.M.H. Walker
发表
D. Schmitt-Landsiedel,
J. Khare,
S. Griep,
1993,
Records of the 1993 IEEE International Workshop on Memory Testing.
D.M.H. Walker,
1989,
[1989] Proceedings International Conference on Wafer Scale Integration.
Bin Xue,
D.M.H. Walker,
2005,
Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005..
D.M.H. Walker,
V. Ramakrishnan,
D. Walker,
1995,
Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'.
D.M.H. Walker,
1992,
[1992] Proceedings International Conference on Wafer Scale Integration.
D.M.H. Walker,
S.S. Sabade,
2004,
17th International Conference on VLSI Design. Proceedings..
D.M.H. Walker,
S. Lakkapragada,
1995,
Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI).
D.M.H. Walker,
D. Gaitonde,
1991,
[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems.
S. Nassif,
D.M.H. Walker,
V.T. Rajan,
1992,
NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits,.
Andrzej J. Strojwas,
D.M.H. Walker,
J. K. Kibarian,
1993
.
Jing Wang,
Weiping Shi,
Xiang Lu,
2004,
Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004).
Bin Xue,
D.M.H. Walker,
2004,
Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004).
D.M.H. Walker,
S. S. Sabade,
2002,
The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002..
D.M.H. Walker,
1992,
Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.
D.M.H. Walker,
1990,
1990 Proceedings. International Conference on Wafer Scale Integration.
D.M.H. Walker,
R. Naik,
1995,
Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI).
D.M.H. Walker,
1993,
1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration.