Roland Brunner

Automatized failure analysis of tungsten coated TSVs via scanning acoustic microscopy

M. Koch, Jochen Kraft, René Hammer, 2016, Microelectron. Reliab..

Method and apparatus for increasing the reliability of devices connected to switching centers information centers

Roland Brunner, Gerhard Roscher, 1999 .

Metallization defect detection in 3D integrated components using scanning acoustic microscopy and acoustic simulations

René Hammer, Franz Schrank, Jördis Rosc, 2018, Microelectron. Reliab..

Simulation of Acoustic Wave Propagation in Aluminium Coatings for Material Characterization

René Hammer, Robert Nuster, Rudolf Zelsacher, 2017 .

Advanced 3D failure characterization in multi-layered PCBs

T. Krivec, René Hammer, Robert Nuster, 2016 .