A. Stricker

Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions

W. Fichtner, H. Wolf, S. Mettler, 1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).

Layout optimization of an ESD-protection n-MOSFET by simulation and measurement

W. Fichtner, A. Stricker, D. Gloor, 1995, Electrical Overstress/Electrostatic Discharge Symposium Proceedings.