M. Komagata

A new method of reducing the particle contamination in semiconductor manufacturing

M. Komagata, M. Komagata, 1995, Proceedings of 1995 Japan International Electronic Manufacturing Technology Symposium.

Evaluation of the particle–particle interactions in a toner by colloid probe AFM

Hidehiro Kamiya, M. Komagata, H. Kamiya, 2008 .