Abdellah Tougui

3D finite element modeling of 3D C2W (chip to wafer) drop test reliability: Optimization of internal architecture and materials

Abdelhake Bouchou, Franck Dosseul, Soufyane Belhenini, 2014, Microelectron. Reliab..

Modelling and analysis of the stress distribution in a multi-thin film system Pt/USG/Si

Pascal Gardes, F. Roqueta, Abdellah Tougui, 2018 .

Intrinsic stress effects on the warpage of silicon substrate during thin film deposition, photolithography and etching processes

Pascal Gardes, Cyril Pujos, Soufyane Belhenini, 2016, 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).