S. D. Millman

Standard cell library characterization for setting current limits for I/sub DDQ/ testing

John M. Acken, S. D. Millman, J. Acken, 1996, Digest of Papers 1996 IEEE International Workshop on IDDQ Testing.

Special applications of the voting model for bridging faults

John M. Acken, S. D. Millman, 1993 .

Detecting stuck-open faults with stuck-at test sets

Edward J. McCluskey, S. D. Millman, 1989, 1989 Proceedings of the IEEE Custom Integrated Circuits Conference.

Improving quality: yield vs. test coverage (WSI)

S. D. Millman, 1993, 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration.

WSI evolution: increasing cell size to generalize designs

S. D. Millman, S. Millman, 1994, Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI).

Fault Model Evolution For Diagnosis: Accuracy vs Precision

John M. Acken, S. D. Millman, J. Acken, 1992, 1992 Proceedings of the IEEE Custom Integrated Circuits Conference.

Accurate modeling and simulation of bridging faults

S. D. Millman, J. A. Acken, S. Millman, 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.