C. W. Soo
发表
Jeffrey Lam,
C. Q. Chen,
G. B. Ang,
2017,
Microelectron. Reliab..
J. Lam,
E. Er,
C. W. Soo,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. W. Soo,
Z. Mo,
I. Tee,
2010,
2010 IEEE International Reliability Physics Symposium.