Kenneth W. Tobin

发表

Optical spatial heterodyned interferometry for inspection of microelectromechanical systems

Kenneth W. Tobin, Philip R. Bingham, Jeffery R. Price, 2007, International Conference on Quality Control by Artificial Vision.

Combining near-infrared illuminants to optimize venous imaging

Kenneth W. Tobin, Fabrice Mériaudeau, Vincent C. Paquit, 2007, SPIE Medical Imaging.

Directional dilation for the connection of piece-wise objects: a semiconductor manufacturing case study

Kenneth W. Tobin, Shaun S. Gleason, S. Gleason, 1996, Proceedings of 3rd IEEE International Conference on Image Processing.

Estimating cross-section semiconductor structure by comparing top-down SEM images

Kenneth W. Tobin, Philip R. Bingham, Jeffery R. Price, 2003, IS&T/SPIE Electronic Imaging.

Image-Based Informatics for Preclinical Biomedical Research

Jens Gregor, Kenneth W. Tobin, Thomas P. Karnowski, 2006, ISVC.

Using an image retrieval system for image data management

Kenneth W. Tobin, Thomas P. Karnowski, Fred Lakhani, 2002, SPIE Advanced Lithography.

Survey of semiconductor data management systems technology

Kenneth W. Tobin, Fred Lakhani, Thomas P. Karnowski, 2000, Advanced Lithography.

Comparison of texture features for segmentation of patterned wafers

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2004, SPIE Optics East.

Preliminary results for mask metrology using spatial heterodyne interferometry

Kenneth W. Tobin, Philip R. Bingham, Marylyn Hoy Bennett, 2003, SPIE Photomask Technology.

Microaneurysm detection with radon transform-based classification on retina images

Kenneth W. Tobin, Thomas P. Karnowski, Fabrice Mériaudeau, 2011, 2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society.

Automatic detection of retina disease: Robustness to image quality and localization of anatomy structure

Kenneth W. Tobin, Thomas P. Karnowski, Y. Li, 2011, 2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society.

Direct to digital holography for semiconductor wafer defect detection and review

Kenneth W. Tobin, Philip R. Bingham, Ayman El-Khashab, 2002, SPIE Advanced Lithography.

Automated Image Analysis in a Web-Based Telemedicine Network

Kenneth W. Tobin, Thomas P. Karnowski, Luca Giancardo, 2009 .

Large-Scale Geospatial Indexing for Image-Based Retrieval and Analysis

Anil M. Cheriyadat, Kenneth W. Tobin, Thomas P. Karnowski, 2005, ISVC.

Industry survey of automatic defect classification technologies, methods, and performance

Kenneth W. Tobin, Fred Lakhani, Thomas P. Karnowski, 2002, SPIE Advanced Lithography.

AUTOMATED ANALYSIS FOR RAPID DEFECT SOURCING AND YIELD LEARNING

Kenneth W. Tobin, Marylyn Hoy Bennett, Shaun S. Gleason, 1997 .

Algorithm for a novel fiber optic weigh-in-motion sensor system

Kenneth W. Tobin, Jeffrey D. Muhs, 1991, Other Conferences.

Fiber optic sensors for composite cure analysis and lifetime nondestructive evaluation

Kenneth W. Tobin, David L. Beshears, G. J. Capps, 1990, Other Conferences.

On the Efficacy of Correcting for Refractive Effects in Iris Recognition

Kenneth W. Tobin, Vincent C. Paquit, Jeffery R. Price, 2007, 2007 IEEE Conference on Computer Vision and Pattern Recognition.

8.2: Presentation session: Welcome/administrative comments: “Overview of measurement science at the Oak Ridge National Laboratory”

Kenneth W. Tobin, 2010 .

Application of fractal encoding techniques for image segmentation

Kenneth W. Tobin, Shaun S. Gleason, Regina K. Ferrell, 2003, International Conference on Quality Control by Artificial Vision.

Image processing and hierarchical temporal memories for automated retina analysis

Kenneth W. Tobin, Thomas P. Karnowski, Yaqin Li, 2010 .

Evaluating the Accuracy of Optic Nerve Detections in Retina Imaging Using Complementary Methods

Kenneth W. Tobin, Thomas P. Karnowski, Michael D. Abràmoff, 2009 .

Content-Based Image Retrieval for Semiconductor Process Characterization

Kenneth W. Tobin, Thomas P. Karnowski, Fred Lakhani, 2002, EURASIP J. Adv. Signal Process..

Content-based segmentation of patterned wafer for automatic threshold determination

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2003, IS&T/SPIE Electronic Imaging.

Near-infrared imaging and structured light ranging for automatic catheter insertion

Kenneth W. Tobin, Fabrice Mériaudeau, Vincent C. Paquit, 2006, SPIE Medical Imaging.

Detection of Anatomic Structures in Human Retinal Imagery

Kenneth W. Tobin, Thomas P. Karnowski, V. Priya Govindasamy, 2007, IEEE Transactions on Medical Imaging.

Accommodating multiple illumination sources in an imaging colorimetry environment

Kenneth W. Tobin, Thomas P. Karnowski, James S. Goddard, 2000, Electronic Imaging.

Guest Editorial: Special Section on Quality Control by Artificial Vision

Luciano da Fontoura Costa, Kenneth W. Tobin, Fabrice Mériaudeau, 2004, J. Electronic Imaging.

Guest Editorial: Special Section on Machine Vision for Industrial Inspection

Kenneth W. Tobin, John W. V. Miller, 2001, J. Electronic Imaging.

3D multispectral light propagation model for subcutaneous veins imaging

Kenneth W. Tobin, Jeffery R. Price, Fabrice Mériaudeau, 2008, SPIE Medical Imaging.

The use of historical defect imagery for yield learning

Kenneth W. Tobin, Thomas P. Karnowski, Fred Lakhani, 2000, 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072).

Nonlinear filter derived from topological image features

Kenneth W. Tobin, Martin A. Hunt, William Bruce Jatko, 1990, Defense, Security, and Sensing.

Overview of automatic defect classification

Kenneth W. Tobin, Shaun S. Gleason, M. H. Bennett, 1994, Proceedings of 1994 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (ASMC).

Fuzzy logic connectivity in semiconductor defect clustering

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 1998, Electronic Imaging.

Rapid yield learning through optical defect and electrical test analysis

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 1998, Advanced Lithography.

Three-dimensional information from real-time encoded images

Kenneth W. Tobin, Joseph N. Mait, Jack S. Brenizer, 1990 .

Detection of semiconductor defects using a novel fractal encoding algorithm

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 2002, SPIE Advanced Lithography.

Blur estimation in limited-control environments

Kenneth W. Tobin, Jeffery R. Price, Timothy F. Gee, 2001, 2001 IEEE International Conference on Acoustics, Speech, and Signal Processing. Proceedings (Cat. No.01CH37221).

Characterization of the optic disc in retinal imagery using a probabilistic approach

Kenneth W. Tobin, Thomas P. Karnowski, V. Priya Govindasamy, 2006, SPIE Medical Imaging.

3D and multispectral imaging for subcutaneous veins detection.

Kenneth W. Tobin, Jeffery R. Price, Vincent C. Paquit, 2009 .

Field-test results of an image retrieval system for semiconductor yield learning

Kenneth W. Tobin, Thomas P. Karnowski, Fred Lakhani, 2001, SPIE LASE.

Direct to Digital Holography

Kenneth W. Tobin, Philip R. Bingham, 2007 .

Textureless Macula Swelling Detection With Multiple Retinal Fundus Images

Kenneth W. Tobin, Thomas P. Karnowski, Fabrice Mériaudeau, 2011, IEEE Transactions on Biomedical Engineering.

High Resolution Three-Dimensional Image Registration

Kenneth W. Tobin, Martin A. Hunt, Bruce Jatko, 1990, Optics & Photonics.

Automated Pattern Recognition: Video Weld Authentication System

Kenneth W. Tobin, John K. Jordan, Stephen W. Allison, 1990, Optics & Photonics.

Integrated applications of inspection data in the semiconductor manufacturing environment

Kenneth W. Tobin, Thomas P. Karnowski, Fred Lakhani, 2001, SPIE LASE.

Patterned wafer segmentation

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2003, International Conference on Quality Control by Artificial Vision.

Fiber-sensor design for turbine engines*

Kenneth W. Tobin, 1991, Optics East.

Microaneurysms detection with the radon cliff operator in retinal fundus images

Kenneth W. Tobin, Thomas P. Karnowski, Fabrice Mériaudeau, 2010, Medical Imaging.

Validation of microaneurysm-based diabetic retinopathy screening across retina fundus datasets

Kenneth W. Tobin, Thomas P. Karnowski, Fabrice Mériaudeau, 2013, Proceedings of the 26th IEEE International Symposium on Computer-Based Medical Systems.

Image paradigm for semiconductor defect data reduction

Kenneth W. Tobin, Thomas P. Karnowski, Hamed Sari-Sarraf, 1996, Advanced Lithography.

Detecting flash artifacts in fundus imagery

Kenneth W. Tobin, Thomas P. Karnowski, Vincent C. Paquit, 2012, 2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society.

Spatial heterodyne interferometry techniques and applications in semiconductor wafer manufacturing

Kenneth W. Tobin, Gregory R. Hanson, Philip R. Bingham, 2004, SPIE Optics + Photonics.

Automated Image Analysis and the Application of Diagnostic Algorithms in an Ocular Telehealth Network

Kenneth W. Tobin, Thomas P. Karnowski, Yaqin Li, 2012 .

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Kenneth W. Tobin, Ning-San Chang, 1998 .

Semiconductor defect data reduction for process automation and characterization

Kenneth W. Tobin, Thomas P. Karnowski, Marylyn Hoy Bennett, 1996 .

An integrated spatial signature analysis and automatic defect classification system

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 1997 .

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA

Kenneth W. Tobin, Iraj Emami, 2006 .

Automatic quality enhancement and nerve fibre layer artefacts removal in retina fundus images by off axis imaging

Kenneth W. Tobin, Fabrice Mériaudeau, Luca Giancardo, 2011, 2011 18th IEEE International Conference on Image Processing.

Image Informatics for Clinical and Preclinical Biomedical Analysis

Jens Gregor, Kenneth W. Tobin, Thomas P. Karnowski, 2008 .

Multiframe combination and blur deconvolution of video data

Kenneth W. Tobin, Thomas P. Karnowski, Timothy F. Gee, 2000, Electronic Imaging.

Automated alignment system for aspheric mirrors

Kenneth W. Tobin, William B. Dress, L. Curt Maxey, 1992, Optics & Photonics.

Gabor filtering for feature extraction on complex images: application to defect detection on semiconductors

Kenneth W. Tobin, Pierrick Bourgeat, Fabrice Meriaudeau, 2006 .

Content-based image retrieval for semiconductor manufacturing

Kenneth W. Tobin, Fred Lakhani, Thomas P. Karnowski, 2000, Electronic Imaging.

Retina lesion and microaneurysm segmentation using morphological reconstruction methods with ground-truth data

Kenneth W. Tobin, Thomas P. Karnowski, V. Priya Govindasamy, 2008, 2008 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society.

Quantifying the value of ownership of yield analysis technologies

Kenneth W. Tobin, Charles Weber, Vijay Sankaran, 1999 .

Adaptation of the fuzzy k-nearest neighbor classifier for manufacturing automation

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 1998, Electronic Imaging.

Phase defect detection with spatial heterodyne interferometry

Kenneth W. Tobin, Philip R. Bingham, Marylyn Hoy Bennett, 2004, SPIE Advanced Lithography.

Technologies to Reactors: Enabling Accelerated Deployment of Nuclear Energy Systems Workshop Report

Kenneth W. Tobin, Lonnie J. Love, A L Qualls, 2018 .

Field test results of an automated image retrieval system

Kenneth W. Tobin, Thomas P. Karnowski, Fred Lakhani, 2001, 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (IEEE Cat. No.01CH37160).

Feature analysis and classification of manufacturing signatures based on semiconductor wafer maps

Kenneth W. Tobin, Shaun S. Gleason, Thomas P. Karnowski, 1997, Electronic Imaging.

Optical Spatial Heterodyned Interferometry for Applications in Semiconductor Inspection and Metrology

Kenneth W. Tobin, Philip R. Bingham, 2006, International Conference on Lasers, Applications, and Technologies.

Application of spatial signature analysis to electrical test data: validation study

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 1999, Advanced Lithography.

Automatic classification of spatial signatures on semiconductor wafer maps

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 1997, Advanced Lithography.

Image retrieval in the industrial environment

Kenneth W. Tobin, Thomas P. Karnowski, Regina K. Ferrell, 1999, Electronic Imaging.

Semiconductor sidewall shape estimation using top-down CD-SEM image retrieval

Kenneth W. Tobin, Philip R. Bingham, Jeffery R. Price, 2003, International Conference on Quality Control by Artificial Vision.

Comparative assessment of yield learning tools using information theory

Kenneth W. Tobin, Charles Weber, Vijay Sankaran, 1999, Other Conferences.

Semiconductor sidewall shape estimation

Kenneth W. Tobin, Philip R. Bingham, Thomas P. Karnowski, 2004, J. Electronic Imaging.

Imaging tristimulus colorimeter for the evaluation of color in printed textiles

Kenneth W. Tobin, James S. Goddard, Thomas P. Karnowski, 1999, Electronic Imaging.

6 th International Conference on Quality Control by Artificial Vision

Kenneth W. Tobin, Philippe Bolon, Fabrice Meriaudeau, 2003 .

Improving light propagation Monte Carlo simulations with accurate 3D modeling of skin tissue

Kenneth W. Tobin, Fabrice Mériaudeau, Vincent C. Paquit, 2008, 2008 15th IEEE International Conference on Image Processing.

Exudate-based diabetic macular edema detection in fundus images using publicly available datasets

Kenneth W. Tobin, Thomas P. Karnowski, Fabrice Mériaudeau, 2012, Medical Image Anal..

Metrology-based Control for Micro-manufacturing

Kenneth W. Tobin, Fred Lakhani, 2001 .

Evaluating Thermographic Phosphors in an Operating Turbine Engine

B. W. Noel, Kenneth W. Tobin, David L. Beshears, 1991 .

Sidewall structure estimation from CD-SEM for lithographic process control

Kenneth W. Tobin, Philip R. Bingham, Jeffery R. Price, 2003, SPIE Advanced Lithography.

3D and multispectral imaging for subcutaneous veins detection

Kenneth W. Tobin, Fabrice Mériaudeau, Vincent C. Paquit, 2009, 2009 16th IEEE International Conference on Image Processing (ICIP).

Detection of cavitation pits on steel surfaces using SEM imagery

Kenneth W. Tobin, Philip R. Bingham, Jeffery R. Price, 2003, International Conference on Quality Control by Artificial Vision.

Automatic retina exudates segmentation without a manually labelled training set

Kenneth W. Tobin, Thomas P. Karnowski, Fabrice Mériaudeau, 2011, 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro.

Automatic defect classification: status and industry trends

Kenneth W. Tobin, Marylyn Hoy Bennett, Shaun S. Gleason, 1995, Advanced Lithography.

Features extraction on complex images

Frédéric Truchetet, Kenneth W. Tobin, Fabrice Mériaudeau, 2004, 2004 International Conference on Image Processing, 2004. ICIP '04..

Segmentation d'images de semiconducteur pour la détection de défauts

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2003 .

Machine vision inspection of technical ceramics

Kenneth W. Tobin, David R. Patek, L. Jachter, 1996, Electronic Imaging.

Retina image analysis and ocular telehealth: The oak ridge national laboratory-hamilton eye institute case study

Kenneth W. Tobin, Thomas P. Karnowski, Luca Giancardo, 2013, 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC).

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA

Kenneth W. Tobin, Christopher P. Ausschnitt, Iraj Emami, 2005 .

Content based segmentation of patterned wafers

Kenneth W. Tobin, Fabrice Mériaudeau, Pierrick Bourgeat, 2004, J. Electronic Imaging.

Inspection in Semiconductor Manufacturing

Kenneth W. Tobin, Fred Lakhani, K. Tobin, 1999 .

Quantifying the value of ownership of yield analysis technologies

Kenneth W. Tobin, G. Scher, K. Tobin, 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295).

Using historical wafermap data for automated yield analysis

Kenneth W. Tobin, Thomas P. Karnowski, Shaun S. Gleason, 1999 .

3D and Multispectral Imaging For Subcutaneous Structures Classification And Analysis

Kenneth W. Tobin, Vincent C. Paquit, Jeffery R. Price, 2009 .

Quality Assessment of Retinal Fundus Images using Elliptical Local Vessel Density

Kenneth W. Tobin, Thomas P. Karnowski, Luca Giancardo, 2010 .

Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers

Kenneth W. Tobin, Philip R. Bingham, Mark A. Schulze, 2003 .

Operator-assisted Threat Assessment : Adaptation of a Focus-of-attention Technique to the Identification of Potential Threat Regions in Carry-on Baggage Imagery

Kenneth W. Tobin, Regina K. Ferrell, K. Tobin, 2001 .

Simulation of skin reflectance images using 3D tissue modeling and multispectral Monte Carlo light propagation

Kenneth W. Tobin, Vincent C. Paquit, Jeffery R. Price, 2008, 2008 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society.

Using a patient image archive to diagnose retinopathy

Kenneth W. Tobin, Thomas P. Karnowski, Luca Giancardo, 2008, 2008 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society.