Mikihiro Kimura

Imaging device with over grid

Mikihiro Kimura, 1988 .

Time-Dependent Dielectric Degradation (TDDD) Influenced by Ultrathin Film Oxidation Process

Tadahiro Ohmi, Mikihiro Kimura, 1996 .

Conduction mechanism and origin of stress‐induced leakage current in thin silicon dioxide films

Tadahiro Ohmi, Mikihiro Kimura, T. Ohmi, 1996 .

Generation Current Reduction at Local Oxidation of Silicon Isolation Edge by Low-Temperature Hydrogen Annealing

Mikihiro Kimura, Kaoru Motonami, Yasuhiko Onodera, 1991 .

Mechanism of time-dependent oxide breakdown in thin thermally grown SiO2 films

Hiroshi Koyama, Mikihiro Kimura, H. Koyama, 1999 .