A. P. Skeats

Reliability testing of opto-electronic components

S. P. Sim, J. V. Collins, C. P. Skrimshire, 1986 .

The identification of copper in long lived GaAlAs double heterostructure lasers by means of electron probe x-ray microanalysis

A. P. Skeats, M. Robertson, B. Wakefield, 1983 .

EBIC microscopy of double‐heterostructure laser materials and devices

A. P. Skeats, R. Heckingbottom, J. Stevenson, 1980 .