Karl-Heinrich Schmidt

Computer vision on magnetic resonance images

Wido Menhardt, Karl-Heinrich Schmidt, W. Menhardt, 1988, Pattern Recognit. Lett..

In-die registration metrology on future-generation reticles

Klaus-Dieter Roeth, Frank Laske, Dieter Adam, 2009, Advanced Lithography.

Explikation medizinischer Beobachtungssprachen

Karl-Heinrich Schmidt, 1986, Wissensarten und ihre Darstellung.

Registration metrology on double patterning reticles

Frank Laske, Oliver Ache, Karl-Heinrich Schmidt, 2009, European Mask and Lithography Conference.

Update on next generation metrology tool for DPL reticles

Klaus-Dieter Roeth, Frank Laske, Dieter Adam, 2010, European Mask and Lithography Conference.

Experimental test results of pattern placement metrology on photomasks with laser illumination source designed to address double patterning lithography challenges

Frank Laske, Dieter Adam, Michael Heiden, 2009, Photomask Technology.

45nm node registration metrology on LTEM EUV reticles

Klaus-Dieter Roeth, Frank Laske, Karl-Heinrich Schmidt, 2008, European Mask and Lithography Conference.

Wissensbasierte Konfigurierung von Interpretationsoperatoren an Hand eines hierarchischen Szenenmodells

Wido Menhardt, Karl-Heinrich Schmidt, 1987, DAGM-Symposium.

Registration measurement capability of VISTEC LMS IPRO4 with focus on small features

Klaus-Dieter Roeth, Frank Laske, Dieter Adam, 2008, Photomask Japan.