A. E. Kozyukov

Equipment and Test Results of the Electronic Components to SEE in the Temperature Range

A. S. Bakerenkov, V. V. Belyakov, V. S. Anashin, 2012, 2012 IEEE Radiation Effects Data Workshop.

Statistics and methodology of multiple cell upset characterization under heavy ion irradiation

R. G. Useinov, A. E. Kozyukov, V. V. Emeliyanov, 2015 .