A. I. Ozerov

Equipment and Test Results of the Electronic Components to SEE in the Temperature Range

A. S. Bakerenkov, V. V. Belyakov, V. S. Anashin, 2012, 2012 IEEE Radiation Effects Data Workshop.

The study of the sensitivity of CMOS integrated circuits to single event latchup using pulsed bremsstrahlung

A. M. Chlenov, V. F. Zinchenko, A. I. Ozerov, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Statistics and methodology of multiple cell upset characterization under heavy ion irradiation

R. G. Useinov, A. E. Kozyukov, V. V. Emeliyanov, 2015 .

Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods

Andrey A. Antonov, Vasily S. Anashin, Maxim S. Gorbunov, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods

P. N. Osipenko, R. G. Useinov, V. V. Emeliyanov, 2012, IEEE Transactions on Nuclear Science.