Chih-Yao Huang

发表

Inserted substrate pickup style with external resistance in an ESD NMOS transistor

Chih-Yao Huang, Fu-Chien Chiu, Bo-Chen Lin, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Well supply voltage effect on escape current of guard rings in epitaxial CMOS technology

Chih-Yao Huang, Ming-Jer Chen, 1998 .

A SCR-buried BJT device for robust ESD protection with high latchup immunity in high-voltage technology

Jen-Chou Tseng, Chih-Yao Huang, Fu-Chien Chiu, 2009, 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Design optimization of ESD protection and latchup prevention for a serial I/O IC

Ming-Dou Ker, Jeng-Chou Tseng, Wei-Fang Chen, 2004, Microelectron. Reliab..

Simulation prediction of electrothermal behaviors of ESD N/PMOS devices

Chih-Yao Huang, Chih-Yao Huang, 2005 .

Interference mitigation for simultaneous operating piconets in MB-OFDM systems

Chih-Yao Huang, Li-Chung Chang, Li-Chung Chang, 2009, 2009 7th International Conference on Information, Communications and Signal Processing (ICICS).

Design model for minority-carrier well-type guard-rings in CMOS circuits

Ching-Yuan Wu, Chih-Yao Huang, Ming-Jer Chen, 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.

Efficient PAPR reduction schemes for MIMO SC-FDMA with space-frequency block codes

Chih-Yao Huang, Li-Chung Chang, Chang-Ju Lin, 2014, Fifth International Conference on Computing, Communications and Networking Technologies (ICCCNT).

Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC product

Ming-Dou Ker, I-Cheng Lin, Chih-Yao Huang, 2003, Microelectron. Reliab..

A high latchup - Immune ESD protection SCR-incorporated BJT in deep submicron technology

Jen-Chou Tseng, Chih-Yao Huang, Fu-Chien Chiu, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Peak power reduction in OFDM via iterative phase reversal

Chih-Yao Huang, Li-Chung Chang, Hung-Chin Yu, 2010, 2010 IEEE 12th International Conference on Communication Technology.

Electron conduction mechanism and band diagram of sputter-deposited Al∕ZrO2∕Si structure

Che-Wei Chang, Chih-Yao Huang, Fu-Chien Chiu, 2005 .

Design model and guidelines for n-well guard ring in epitaxial CMOS

Chih-Yao Huang, Ming-Jer Chen, 1994 .

Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC product

Ming-Dou Ker, Jen-Chou Tseng, Chih-Yao Huang, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

An SCR-Incorporated BJT Device for Robust ESD Protection With High Latchup Immunity in High-Voltage Technology

Jen-Chou Tseng, Chih-Yao Huang, Fu-Chien Chiu, 2012, IEEE Transactions on Device and Materials Reliability.

Analytical design formulation for minority-carrier well-type guard rings in CMOS circuits

Chih-Yao Huang, Ping-Nan Tseng, Ming-Jer Chen, 1993 .