Renan Alves Fonseca

A statistical simulation method for reliability analysis of SRAM core-cells

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2010, Design Automation Conference.

Impact of Resistive-Bridging Defects in SRAM Core-Cell

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2010, 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications.

On using address scrambling to implement defect tolerance in SRAMs

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2011, 2011 IEEE International Test Conference.

Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2012, J. Electron. Test..

Variability Analysis of an SRAM Test Chip

Arnaud Virazel, Alberto Bosio, Patrick Girard, 2011, ETS 2011.

SRAM Core-cell Quality Metrics

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2009 .

Setting test conditions for improving SRAM reliability

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2010, 2010 15th IEEE European Test Symposium.

Detecting NBTI induced failures in SRAM core-cells

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2010, 2010 28th VLSI Test Symposium (VTS).

Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2010, 2010 15th IEEE European Test Symposium.