R. Baumann

The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction

R. Baumann, 2002, Digest. International Electron Devices Meeting,.

Comparison of product failure rate to the component soft error rates in a multi-core digital signal processor

R. Baumann, Xiaowei Zhu, C. Cirba, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..