S. Martin

Accuracy improvement of the "Single Pattern Driver" method for the characterization of interconnect capacitance in the context of nanometer technology development

H. Brut, B. Froment, S. Martin, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

An 8 Mbit DRAM design using a 1 Tbulk cell

R. Ranica, A. Villaret, P. Candelier, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005..