Bruno Riccò

发表

A probabilistic fault model for analog faults

Michele Favalli, Piero Olivo, Bruno Riccò, 1991, Proceedings of the European Conference on Design Automation..

MOBIE: a Movie Brain Interactive Editor

Bruno Riccò, Marco Marchesi, Elisabetta Farella, 2011, SIGGRAPH Asia Emerging Technologies.

Automated DNA sizing in atomic force microscope images

Luca Benini, Bruno Riccò, Elisa Ficarra, 2002, Proceedings IEEE International Symposium on Biomedical Imaging.

On-line testing of transient and crosstalk faults affecting interconnections of FPGA-implemented systems

Cecilia Metra, Bruno Riccò, Andrea Pagano, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

Signal Coding and CMOS Gates for Combinational Functional Blocks of Very Deep Submicron Self-checking Circuits

Cecilia Metra, Michele Favalli, Bruno Riccò, 2000, VLSI Design.

Computer Vision Approach for the Determination of Microbial Concentration and Growth Kinetics Using a Low Cost Sensor System

Bruno Riccò, Marco Grossi, Carola Parolin, 2019, Sensors.

On-line testing and diagnosis of bus lines with respect to intermediate voltage values (poster paper)

Cecilia Metra, Michele Favalli, Bruno Riccò, 2000, DATE '00.

Design rules for CMOS self checking circuits with parametric faults in the functional block

Cecilia Metra, Michele Favalli, Piero Olivo, 1993, Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Evaluation of clock distribution networks' most likely faults and produced effects

Cecilia Metra, Bruno Riccò, T. M. Mak, 2001, Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs

Michele Favalli, Piero Olivo, Bruno Riccò, 1992, Proceedings International Test Conference 1992.

BRAVO: a brain virtual operator for education exploiting brain-computer interfaces

Bruno Riccò, Marco Marchesi, 2013, CHI Extended Abstracts.

3dID: a low-power, low-cost hand motion capture device

Luca Benini, Bruno Riccò, Elisabetta Farella, 2006, Proceedings of the Design Automation & Test in Europe Conference.

Analysis of dynamic effects of resistive bridging faults in CMOS and BiCMOS digital ICs

Michele Favalli, Piero Olivo, Bruno Riccò, 1993, Proceedings of IEEE International Test Conference - (ITC).

Reliability evaluation of combinational logic circuits by symbolic simulation

Piero Olivo, Bruno Riccò, Alessandro Bogliolo, 1995, Proceedings 13th IEEE VLSI Test Symposium.

Detection of PLA multiple crosspoint faults

Michele Favalli, Piero Olivo, Bruno Riccò, 1991, Proceedings of the European Conference on Design Automation..

Gate-level current waveform simulation of CMOS integrated circuits

Luca Benini, Giovanni De Micheli, Bruno Riccò, 1996, ISLPED.

Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults

Cecilia Metra, Michele Favalli, Bruno Riccò, 2003, Microelectron. J..

Fault diagnosis and test of DNA sensor arrays by using IFA approach

Daniela De Venuto, Bruno Riccò, B. Riccò, 2009, Microelectron. J..

System lifetime extension by battery management: an experimental work

Luca Benini, Bruno Riccò, Davide Bruni, 2002, CASES '02.

Introduction to ASICs

Bruno Riccò, B. Riccò, 2017 .

A novel critical path heuristic for fast fault grading

Michele Favalli, Piero Olivo, Bruno Riccò, 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines

Cecilia Metra, Michele Favalli, Bruno Riccò, 2000, IEEE Trans. Computers.

GLOVR: a wearable hand controller for virtual reality applications

Bruno Riccò, Marco Marchesi, 2016, VRIC.

Modeling of broken connections faults in CMOS ICs

Michele Favalli, Piero Olivo, Bruno Riccò, 1994, Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.

Highly testable and compact 1-out-of-n CMOS checkers

Cecilia Metra, Michele Favalli, Bruno Riccò, 1994, IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Power aware network interface management for streaming multimedia

Luca Benini, Bruno Riccò, Davide Bertozzi, 2002, 2002 IEEE Wireless Communications and Networking Conference Record. WCNC 2002 (Cat. No.02TH8609).

Highly testable and compact single output comparator

Cecilia Metra, Michele Favalli, Bruno Riccò, 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays

Daniela De Venuto, Bruno Riccò, 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).

A numerical method to compute isotropic band models from anisotropic semiconductor band structures

Bruno Riccò, Enrico Sangiorgi, Antonio Abramo, 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Augmented graphics for interactive storytelling on a mobile device

Bruno Riccò, Marco Marchesi, 2013, SA '13.

A testing technique to characterize E/sup 2/PROM's aging and endurance

Piero Olivo, Bruno Riccò, Mattia Lanzoni, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

Aliasing in signature analysis testing with multiple input shift registers

Michele Favalli, Piero Olivo, Bruno Riccò, 1990, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

An analytical model for the aliasing probability in signature analysis testing

Michele Favalli, Piero Olivo, Bruno Riccò, 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Fault simulation of parametric bridging faults in CMOS IC's

Michele Favalli, Piero Olivo, Bruno Riccò, 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

On-line testing scheme for clock's faults

Cecilia Metra, Michele Favalli, Bruno Riccò, 1997, Proceedings International Test Conference 1997.

A smart wireless glove for gesture interaction

Luca Benini, Bruno Riccò, Elisabetta Farella, 2008, SIGGRAPH '08.

Digital Window Comparator DfT Scheme for Mixed-Signal ICs

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2002, J. Electron. Test..

Pervasive computing for interactive virtual heritage

Luca Benini, Bruno Riccò, Elisabetta Farella, 2005, IEEE MultiMedia.

Energy-efficient and reliable low-swing signaling for on-chip buses based on redundant coding

Luca Benini, Bruno Riccò, Davide Bertozzi, 2002, 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).

Gate-level power and current simulation of CMOS integrated circuits

Luca Benini, Giovanni De Micheli, Bruno Riccò, 1997, IEEE Trans. Very Large Scale Integr. Syst..

Testability measures in pseudorandom testing

Michele Favalli, Piero Olivo, Bruno Riccò, 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Capacitance DNA bio-chips improved by new probe immobilization strategies

Luca Benini, Yusuf Leblebici, Giovanni De Micheli, 2010, Microelectron. J..

Automatic Window Repositioning Technique for Digital Window Comparator Used Within Mixed-Signal Design-for Testability Schemes

Bruno Riccò, Michael J. Ohletz, Daniela Venuto, 2005 .

Fault simulation of unconventional faults in CMOS circuits

Michele Favalli, Piero Olivo, Bruno Riccò, 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Processor frequency setting for energy minimization of streaming multimedia application

Luca Benini, Bruno Riccò, Andrea Acquaviva, 2001, Ninth International Symposium on Hardware/Software Codesign. CODES 2001 (IEEE Cat. No.01TH8571).

Microscopic aspects of defect generation in SiO2

Bruno Riccò, Fernanda Irrera, Ruggero Feruglio, 2002, Microelectron. Reliab..

An adaptive data compression scheme for memory traffic minimization in processor-based systems

Luca Benini, Enrico Macii, Alberto Macii, 2002, 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).

Gesture Signature for Ambient Intelligence Applications: A Feasibility Study

Luca Benini, M. Sile O'Modhrain, Bruno Riccò, 2006, Pervasive.

An adaptive algorithm for low-power streaming multimedia processing

Luca Benini, Bruno Riccò, Andrea Acquaviva, 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.

A highly testable 1-out-of-3 CMOS checker

Cecilia Metra, Michele Favalli, Piero Olivo, 1993, Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits

Cecilia Metra, Michele Favalli, Piero Olivo, 1997, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Compact and highly testable error indicator for self-checking circuits

Cecilia Metra, Michele Favalli, Bruno Riccò, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Overview of embedded systems peripherals

Bruno Riccò, B. Riccò, 2017 .

Parametric Bridging Fault Characterieation for the Fault Simulation of Library-Based ICs

Michele Favalli, Piero Olivo, Bruno Riccò, 1992, Proceedings International Test Conference 1992.

Smart sensors for fast biological analysis

Bruno Riccò, Claudio Stagni, Massimo Lanzoni, 2007, 2007 2nd International Workshop on Advances in Sensors and Interface.

Automatic repositioning technique for digital cell based window comparators and implementation within mixed-signal DfT schemes

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2003, Fourth International Symposium on Quality Electronic Design, 2003. Proceedings..

Analysis and Design of Linear Finite State Machines for Signature Analysis Testing

Piero Olivo, Bruno Riccò, Maurizio Damiani, 1991, IEEE Trans. Computers.

MOS2: an efficient MOnte Carlo Simulator for MOS devices

Bruno Riccò, Enrico Sangiorgi, Franco Venturi, 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Hardware-software design of a smart sensor for fully-electronic DNA hybridization detection

Luca Benini, Bruno Riccò, Carlotta Guiducci, 2005, Design, Automation and Test in Europe.

Self-checking scheme for very fast clocks' skew correction

Cecilia Metra, Bruno Riccò, Mani Soma, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Monitoring system activity for OS-directed dynamic power management

Luca Benini, Bruno Riccò, Alessandro Bogliolo, 1998, Proceedings. 1998 International Symposium on Low Power Electronics and Design (IEEE Cat. No.98TH8379).

Fast and compact error correcting scheme for reliable multilevel flash memories

Cecilia Metra, Bruno Riccò, Daniele Rossi, 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).

Aware and smart environments: The Casattenta project

Bruno Riccò, Elisabetta Farella, Mirko Falavigna, 2009, 2009 3rd International Workshop on Advances in sensors and Interfaces.

A probabilistic fault model for 'analog' faults in digital CMOS circuits

Michele Favalli, Piero Olivo, Bruno Riccò, 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Efficient switching activity computation during high-level synthesis of control-dominated designs

Luca Benini, Giovanni De Micheli, Bruno Riccò, 1999, Proceedings. 1999 International Symposium on Low Power Electronics and Design (Cat. No.99TH8477).

A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs

Michele Favalli, Bruno Riccò, L. Penza, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.

Analysis of resistive bridging fault detection in BiCMOS digital ICs

Michele Favalli, Piero Olivo, Bruno Riccò, 1993, IEEE Trans. Very Large Scale Integr. Syst..

CMOS design for improved IC testability

Michele Favalli, Piero Olivo, Bruno Riccò, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

Parametric timing and power macromodels for high level simulation of low-swing interconnects

Luca Benini, Bruno Riccò, Davide Bertozzi, 2002, ISLPED '02.

GMOS Checkers with Testable Bridging and Transistor Stuck-on Faults

Cecilia Metra, Michele Favalli, Piero Olivo, 1992, Proceedings International Test Conference 1992.

A new stress sensor for force/torque measurements

Bruno Riccò, Claudio Melchiorri, Luigi Biagiotti, 2002, Proceedings 2002 IEEE International Conference on Robotics and Automation (Cat. No.02CH37292).

Design of Digital Window Comparators and their Implementation within Mixed-Signal DfT Schemes

Bruno Riccò, Daniela De Venuto, Michael J. Ohletz, 2003 .

Innovative Optoelectronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices

Bruno Riccò, Carlotta Guiducci, Davide Caputo, 2006, 2006 IFIP International Conference on Very Large Scale Integration.

Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults

Cecilia Metra, Michele Favalli, Piero Olivo, 1995, J. Electron. Test..

Linux-Based Data Acquisition and Processing on Palmtop Computer

Luca Benini, Bruno Riccò, Massimo Lanzoni, 2006, IEEE Transactions on Instrumentation and Measurement.

Highly testable and compact 1-out-of-n code checker with single output

Cecilia Metra, Michele Favalli, Bruno Riccò, 1998, Proceedings Design, Automation and Test in Europe.

High Resolution Read-Out Circuit for DNA Label-Free Detection System

Daniela De Venuto, Bruno Riccò, 2008, 9th International Symposium on Quality Electronic Design (isqed 2008).

MOCA: A Low-Power, Low-Cost Motion Capture System Based on Integrated Accelerometers

Luca Benini, Bruno Riccò, Elisabetta Farella, 2007, Adv. Multim..

Signal coding technique and CMOS gates for strongly fault-secure combinational functional blocks

Cecilia Metra, Michele Favalli, Bruno Riccò, 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).

An improved procedure to test CMOS ICs for latch-up

Roberto Menozzi, Bruno Riccò, Mattia Lanzoni, 1990, Proceedings. International Test Conference 1990.

Concurrent Checking of Clock Signal Correctness

Cecilia Metra, Michele Favalli, Bruno Riccò, 1998, IEEE Des. Test Comput..

VLSI low power design

Bruno Riccò, 2017 .

Innovative Optoeletronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices

Bruno Riccò, Carlotta Guiducci, Davide Caputo, 2006, VLSI-SoC.

Dynamic effects in the detection of bridging faults in CMOS ICs

Michele Favalli, Piero Olivo, Bruno Riccò, 1992, J. Electron. Test..

On-Chip Clock Faults' Detector

Cecilia Metra, Michele Favalli, Bruno Riccò, 2002, J. Electron. Test..

Low Power Control Techniques For TFT LCD Displays

Luca Benini, Bruno Riccò, Andrea Acquaviva, 2002, CASES '02.

Self-positioning digital window comparators for mixed-signal DfT

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2003, EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696).

Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's

Bruno Riccò, Enrico Sangiorgi, Carlo Jacoboni, 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Embedded Systems' Development

Bruno Riccò, 2017 .

Fast and compact error correcting scheme for reliable multilevel flash memories

Cecilia Metra, Bruno Riccò, Daniele Rossi, 2002, Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).

Embedded two-rail checkers with on-line testing ability

Cecilia Metra, Michele Favalli, Bruno Riccò, 1996, Proceedings of 14th VLSI Test Symposium.

Design and characterization of novel read-out systems for a capacitive DNA sensor

Daniela De Venuto, Bruno Riccò, 2006, Microelectron. J..

Testing of analogue circuits via (standard) digital gates

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2002, Proceedings International Symposium on Quality Electronic Design.

CMOS self checking circuits with faulty sequential functional blocks

Cecilia Metra, Michele Favalli, Bruno Riccò, 1994, IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Self-checking scheme for the on-line testing of power supply noise

Cecilia Metra, Michele Favalli, Bruno Riccò, 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

Energy characterization of embedded real-time operating systems

Luca Benini, Bruno Riccò, Andrea Acquaviva, 2001, CARN.

Software-controlled processor speed setting for low-power streamingmultimedia

Luca Benini, Bruno Riccò, Andrea Acquaviva, 2001, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Power estimation of cell-based CMOS circuits

Luca Benini, Bruno Riccò, Alessandro Bogliolo, 1996, DAC '96.

On-chip signal level evaluation for mixed-signal ICs using digital window comparators

Daniela De Venuto, Bruno Riccò, M. J. Ohletzo, 2001, IEEE European Test Workshop, 2001..

Design and implementation of WiMoCA node for a body area wireless sensor network

Luca Benini, Bruno Riccò, Elisabetta Farella, 2005, 2005 Systems Communications (ICW'05, ICHSN'05, ICMCS'05, SENET'05).

Compact and low power on-line self-testing voting scheme

Cecilia Metra, Michele Favalli, Bruno Riccò, 1997, 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Tree checkers for applications with low power-delay requirements

Cecilia Metra, Michele Favalli, Bruno Riccò, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Testing of E2PROM aging and endurance: A case study

Roberto Menozzi, Piero Olivo, Bruno Riccò, 1990, Eur. Trans. Telecommun..

On-line detection of logic errors due to crosstalk, delay, and transient faults

Cecilia Metra, Michele Favalli, Bruno Riccò, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs

Bruno Riccò, Enrico Sangiorgi, Mark R. Pinto, 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Design of an integrated low-noise read-out system for DNA capacitive sensors

Daniela De Venuto, Bruno Riccò, Sandro Carrara, 2009, Microelectron. J..

OIL CONCENTRATION MEASUREMENT IN METALWORKING FLUIDS BY OPTICAL SPECTROSCOPY

Bruno Riccò, Marco Grossi, 2014 .

New insights for using self-assembly materials to improve the detection stability in label-free DNA-chip and immuno-sensors.

Luca Benini, Bruno Riccò, Sandro Carrara, 2009, Biosensors & bioelectronics.