Bruno Riccò
发表
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1991,
Proceedings of the European Conference on Design Automation..
Bruno Riccò,
Marco Marchesi,
Elisabetta Farella,
2011,
SIGGRAPH Asia Emerging Technologies.
Luca Benini,
Bruno Riccò,
Elisa Ficarra,
2002,
Proceedings IEEE International Symposium on Biomedical Imaging.
Cecilia Metra,
Bruno Riccò,
Andrea Pagano,
2001,
Proceedings International Test Conference 2001 (Cat. No.01CH37260).
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
2000,
VLSI Design.
Bruno Riccò,
Marco Grossi,
Carola Parolin,
2019,
Sensors.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
2000,
DATE '00.
Cecilia Metra,
Michele Favalli,
Piero Olivo,
1993,
Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.
Cecilia Metra,
Bruno Riccò,
T. M. Mak,
2001,
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1992,
Proceedings International Test Conference 1992.
Bruno Riccò,
Marco Marchesi,
2013,
CHI Extended Abstracts.
Luca Benini,
Bruno Riccò,
Elisabetta Farella,
2006,
Proceedings of the Design Automation & Test in Europe Conference.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1993,
Proceedings of IEEE International Test Conference - (ITC).
Piero Olivo,
Bruno Riccò,
Alessandro Bogliolo,
1995,
Proceedings 13th IEEE VLSI Test Symposium.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1991,
Proceedings of the European Conference on Design Automation..
Luca Benini,
Giovanni De Micheli,
Bruno Riccò,
1996,
ISLPED.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
2003,
Microelectron. J..
Daniela De Venuto,
Bruno Riccò,
B. Riccò,
2009,
Microelectron. J..
Luca Benini,
Bruno Riccò,
Davide Bruni,
2002,
CASES '02.
Bruno Riccò,
B. Riccò,
2017
.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1991,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
2000,
IEEE Trans. Computers.
Bruno Riccò,
Marco Marchesi,
2016,
VRIC.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1994,
Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1994,
IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.
Luca Benini,
Bruno Riccò,
Davide Bertozzi,
2002,
2002 IEEE Wireless Communications and Networking Conference Record. WCNC 2002 (Cat. No.02TH8609).
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1997,
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).
Daniela De Venuto,
Bruno Riccò,
2007,
8th International Symposium on Quality Electronic Design (ISQED'07).
Bruno Riccò,
Enrico Sangiorgi,
Antonio Abramo,
1993,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Bruno Riccò,
Marco Marchesi,
2013,
SA '13.
Piero Olivo,
Bruno Riccò,
Mattia Lanzoni,
1989,
Proceedings. 'Meeting the Tests of Time'., International Test Conference.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1990,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1989,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1993,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1997,
Proceedings International Test Conference 1997.
Luca Benini,
Bruno Riccò,
Elisabetta Farella,
2008,
SIGGRAPH '08.
Daniela De Venuto,
Bruno Riccò,
Michael J. Ohletz,
2002,
J. Electron. Test..
Luca Benini,
Bruno Riccò,
Elisabetta Farella,
2005,
IEEE MultiMedia.
Luca Benini,
Bruno Riccò,
Davide Bertozzi,
2002,
2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).
Luca Benini,
Giovanni De Micheli,
Bruno Riccò,
1997,
IEEE Trans. Very Large Scale Integr. Syst..
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1992,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Luca Benini,
Yusuf Leblebici,
Giovanni De Micheli,
2010,
Microelectron. J..
Bruno Riccò,
Michael J. Ohletz,
Daniela Venuto,
2005
.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1991,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Luca Benini,
Bruno Riccò,
Andrea Acquaviva,
2001,
Ninth International Symposium on Hardware/Software Codesign. CODES 2001 (IEEE Cat. No.01TH8571).
Bruno Riccò,
Fernanda Irrera,
Ruggero Feruglio,
2002,
Microelectron. Reliab..
Luca Benini,
Enrico Macii,
Alberto Macii,
2002,
2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).
Luca Benini,
M. Sile O'Modhrain,
Bruno Riccò,
2006,
Pervasive.
Luca Benini,
Bruno Riccò,
Andrea Acquaviva,
2001,
Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.
Cecilia Metra,
Michele Favalli,
Piero Olivo,
1993,
Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.
Cecilia Metra,
Michele Favalli,
Piero Olivo,
1997,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1996,
Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Bruno Riccò,
B. Riccò,
2017
.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1992,
Proceedings International Test Conference 1992.
Bruno Riccò,
Claudio Stagni,
Massimo Lanzoni,
2007,
2007 2nd International Workshop on Advances in Sensors and Interface.
Daniela De Venuto,
Bruno Riccò,
Michael J. Ohletz,
2003,
Fourth International Symposium on Quality Electronic Design, 2003. Proceedings..
Piero Olivo,
Bruno Riccò,
Maurizio Damiani,
1991,
IEEE Trans. Computers.
Bruno Riccò,
Enrico Sangiorgi,
Franco Venturi,
1988,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Luca Benini,
Bruno Riccò,
Carlotta Guiducci,
2005,
Design, Automation and Test in Europe.
Cecilia Metra,
Bruno Riccò,
Mani Soma,
1999,
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Luca Benini,
Bruno Riccò,
Alessandro Bogliolo,
1998,
Proceedings. 1998 International Symposium on Low Power Electronics and Design (IEEE Cat. No.98TH8379).
Cecilia Metra,
Bruno Riccò,
Daniele Rossi,
2002,
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).
Bruno Riccò,
Elisabetta Farella,
Mirko Falavigna,
2009,
2009 3rd International Workshop on Advances in sensors and Interfaces.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1992,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Luca Benini,
Giovanni De Micheli,
Bruno Riccò,
1999,
Proceedings. 1999 International Symposium on Low Power Electronics and Design (Cat. No.99TH8477).
Michele Favalli,
Bruno Riccò,
L. Penza,
1995,
Proceedings the European Design and Test Conference. ED&TC 1995.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1993,
IEEE Trans. Very Large Scale Integr. Syst..
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1989,
Proceedings. 'Meeting the Tests of Time'., International Test Conference.
Luca Benini,
Bruno Riccò,
Davide Bertozzi,
2002,
ISLPED '02.
Cecilia Metra,
Michele Favalli,
Piero Olivo,
1992,
Proceedings International Test Conference 1992.
Bruno Riccò,
Claudio Melchiorri,
Luigi Biagiotti,
2002,
Proceedings 2002 IEEE International Conference on Robotics and Automation (Cat. No.02CH37292).
Bruno Riccò,
Daniela De Venuto,
Michael J. Ohletz,
2003
.
Bruno Riccò,
Carlotta Guiducci,
Davide Caputo,
2006,
2006 IFIP International Conference on Very Large Scale Integration.
Cecilia Metra,
Michele Favalli,
Piero Olivo,
1995,
J. Electron. Test..
Luca Benini,
Bruno Riccò,
Massimo Lanzoni,
2006,
IEEE Transactions on Instrumentation and Measurement.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1998,
Proceedings Design, Automation and Test in Europe.
Daniela De Venuto,
Bruno Riccò,
2008,
9th International Symposium on Quality Electronic Design (isqed 2008).
Luca Benini,
Bruno Riccò,
Elisabetta Farella,
2007,
Adv. Multim..
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1998,
Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).
Roberto Menozzi,
Bruno Riccò,
Mattia Lanzoni,
1990,
Proceedings. International Test Conference 1990.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1998,
IEEE Des. Test Comput..
Bruno Riccò,
2017
.
Bruno Riccò,
Carlotta Guiducci,
Davide Caputo,
2006,
VLSI-SoC.
Michele Favalli,
Piero Olivo,
Bruno Riccò,
1992,
J. Electron. Test..
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
2002,
J. Electron. Test..
Luca Benini,
Bruno Riccò,
Andrea Acquaviva,
2002,
CASES '02.
Daniela De Venuto,
Bruno Riccò,
Michael J. Ohletz,
2003,
EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696).
Bruno Riccò,
Enrico Sangiorgi,
Carlo Jacoboni,
1991,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Bruno Riccò,
2017
.
Cecilia Metra,
Bruno Riccò,
Daniele Rossi,
2002,
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1996,
Proceedings of 14th VLSI Test Symposium.
Daniela De Venuto,
Bruno Riccò,
2006,
Microelectron. J..
Daniela De Venuto,
Bruno Riccò,
Michael J. Ohletz,
2002,
Proceedings International Symposium on Quality Electronic Design.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1994,
IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
2002,
Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.
Luca Benini,
Bruno Riccò,
Andrea Acquaviva,
2001,
CARN.
Luca Benini,
Bruno Riccò,
Andrea Acquaviva,
2001,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Luca Benini,
Bruno Riccò,
Alessandro Bogliolo,
1996,
DAC '96.
Daniela De Venuto,
Bruno Riccò,
M. J. Ohletzo,
2001,
IEEE European Test Workshop, 2001..
Luca Benini,
Bruno Riccò,
Elisabetta Farella,
2005,
2005 Systems Communications (ICW'05, ICHSN'05, ICMCS'05, SENET'05).
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1997,
1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1996,
Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Roberto Menozzi,
Piero Olivo,
Bruno Riccò,
1990,
Eur. Trans. Telecommun..
Cecilia Metra,
Michele Favalli,
Bruno Riccò,
1998,
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
Bruno Riccò,
Enrico Sangiorgi,
Mark R. Pinto,
1989,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Daniela De Venuto,
Bruno Riccò,
Sandro Carrara,
2009,
Microelectron. J..
Bruno Riccò,
Marco Grossi,
2014
.
Luca Benini,
Bruno Riccò,
Sandro Carrara,
2009,
Biosensors & bioelectronics.