J S Villarrubia

Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetry

A E Vladár, J S Villarrubia, V N Tondare, 2016, SPIE Advanced Lithography.

Blind estimation of general tip shape in AFM imaging.

Xiaoping Qian, J S Villarrubia, Xiaoping Qian, 2008, Ultramicroscopy.

General three-dimensional image simulation and surface reconstruction in scanning probe microscopy using a dexel representation.

Xiaoping Qian, J S Villarrubia, Xiaoping Qian, 2007, Ultramicroscopy.