Hideki Maruyama

Practical measurement system for determination of refractive index and thickness using low-coherence interferometry

Masato Ohmi, Masamitsu Haruna, Shogo Inoue, 1999, Other Conferences.

Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement

Kazuhisa Yanagi, Takashi Miyaguchi, Masato Aketagawa, 2009 .

Refractive Index Changes of Amorphous Diarylethenes Containing 2,4-Diphenylphenyl Substituents

Masahiro Irie, Tsuyoshi Kawai, Myeong-Suk Kim, 2003 .

Novel Nondestructive Readout Methods For Near-field Optical Recording with Large Refractive Index Modulation in Amorphous Diarylethene Layer

Masahiro Irie, Tsuyoshi Kawai, Myeong-Suk Kim, 2004 .

Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index

Masato Ohmi, Masamitsu Haruna, Hideki Maruyama, 2000 .

TE-TM Mode Splitter Using Directional Coupling Between Heterogenbous Waveguides in LiNb03

Hiroshi Nishihara, Masamitsu Haruna, Hideki Maruyama, 1995 .

Low-coherence interferometer system for the simultaneous measurement of refractive index and thickness.

Masato Ohmi, Masamitsu Haruna, Hideki Maruyama, 2002, Applied optics.