C W See

Subpixel microscopic deformation analysis using correlation and artificial neural networks.

M Pitter, C W See, M Somekh, 2001, Optics express.

High-resolution scanning surface-plasmon microscopy.

M G Somekh, C W See, M. Somekh, 2000, Applied optics.

Scanning optical microellipsometer for pure surface profiling.

M G Somekh, C W See, M. Somekh, 1996, Applied optics.

Two‐photon fluorescence surface wave microscopy

M G Somekh, C W See, M. Somekh, 2005, Journal of microscopy.

Ultrastable absolute-phase common-path optical profiler based on computer-generated holography.

M G Somekh, M Clark, C W See, 1998, Applied optics.

Scanning differential phase contrast optical microscope: application to surface studies.

C W See, H. K. Wickramasinghe, C. See, 1985, Applied optics.

Quantitative optical microscope with enhanced resolution using a pixelated liquid crystal spatial light modulator

M G Somekh, C W See, M. Somekh, 2004, Journal of microscopy.