Nadia Rezzak

发表

High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors

Ronald D. Schrimpf, Daniel M. Fleetwood, R. Arinero, 2011, Microelectron. Reliab..

Combine Flash-Based FPGA TID and Long-Term Retention Reliabilities Through ${{\rm V}_{\rm T}}$ Shift

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva, 2016, IEEE Transactions on Nuclear Science.

TID, ELDRS and SEE hardening and testing on mixed signal telemetry LX7730 controller

Mathieu Sureau, Nadia Rezzak, Russell Stevens, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA

Nadia Rezzak, Jih-Jong Wang, Victor Nguyen, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies

Ronald D. Schrimpf, Daniel M. Fleetwood, Michael L. Alles, 2012, Microelectron. Reliab..

Total ionizing dose effects in advanced CMOS technologies

Nadia Rezzak, N. Rezzak, 2012 .

Proton Characterization of RTG4 Flash-Based FPGA for LEO Environment

Nadia Rezzak, Jih-Jong Wang, Frank Hawley, 2019, 2019 IEEE Radiation Effects Data Workshop.

TID Testing of Microsemi Integrated Motor Controller LX7720 Power Driver with Rotation and Current Sensing

Mathieu Sureau, Nadia Rezzak, Marco Leuenberger, 2018, 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).

Flash-Based FPGA TID and Long-Term Retention Reliability through VT Shift Investigation

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva, 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

The sensitivity of radiation-induced leakage to STI topology and sidewall doping

John Sochacki, Lloyd W. Massengill, Ronald D. Schrimpf, 2011, Microelectron. Reliab..

Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Single event effects hardening on 65 nm Flash-based field programmable gate array

John McCollum, Nadia Rezzak, Jih-Jong Wang, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

SET and SEFI Characterization of the 65 nm SmartFusion2 Flash-Based FPGA under Heavy Ion Irradiation

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

TID and SEE Characterization of Microsemi's 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Single Event Effects Testing on the SERDES, Fabric Flip-Flops and PLL in a Radiation-Hardened Flash-Based FPGA-RT4G150

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).

Radiation Effects in 65 nm Flash-Based Field Programmable Gate Array

Nadia Rezzak, Jih-Jong Wang, Durwyn Dsilva, 2016 .

Including the effects of process-related variability on radiation response using a new test chip

Donglin Wang, Yanjun Wu, Yanfeng Li, 2010, 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.

Total-ionizing-dose radiation response of partially-depleted SOI devices

En Xia Zhang, Ronald D. Schrimpf, Michael L. Alles, 2010, 2010 IEEE International SOI Conference (SOI).

Development of Radiation-Hardened Flash-Based Field Programmable Gate Array RTG 4

John McCollum, Nadia Rezzak, Durwyn Dsilva, 2016 .

A Novel 65 nm Radiation Tolerant Flash Configuration Cell Used in RTG4 Field Programmable Gate Array

John McCollum, Nadia Rezzak, Durwyn Dsilva, 2015, IEEE Transactions on Nuclear Science.

Single Event Latch-Up Hardening Using TCAD Simulations in 130 nm and 65 nm Embedded SRAM in Flash-Based FPGAs

Nadia Rezzak, N. Rezzak, Jih-Jong Wang, 2015, IEEE Transactions on Nuclear Science.

Single Event Effects Characterization in 65 nm Flash-Based FPGA-SOC

Nadia Rezzak, Durwyn Dsilva, Stephen Varela, 2014 .

In-Beam Programming of Radiation-Hardened Flash-Based FPGA—RTG4

Nadia Rezzak, Salim Samiee, Victor Nguyen, 2017, 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Neutron and Proton Characterization of Microsemi 28 nm PolarFire SONOS-Based FPGA

Nadia Rezzak, Gregory Bakker, Stephen Varela, 2018, 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).