D. S. Campbell

发表

Model for reliability prediction of thick film resistors

R. B. Pranchov, D. S. Campbell, 1984 .

Powered testing of electrical contacts in mixed flowing gases

D. S. Campbell, N. A. Stennett, T. P. Ireland, 1990 .

RESEARCH AND DEVELOPMENT IN THE FIELD OF PASSIVE COMPONENTS

D. S. Campbell, 1974 .

The structure of vacuum condensed Ni-Cr films

D. S. Campbell, R. W. Bicknell, H. Blackburn, 1964 .

Stability Observations and Surface Analysis of Air Fired Nickel Thick Film Conductors

R. B. Pranchov, D. S. Campbell, 1985 .

Thermal failure in semiconductor devices

D. S. Campbell, Vincent M. Dwyer, A. J. Franklin, 1990 .

The organization of a study of the field failure of electronic components

D. S. Campbell, J. A. Hayes, D. R. Hetherington, 1987 .

An analysis of the field failure of passive and active components

D. S. Campbell, J. A. Hayes, 1990 .

A Comparison Between GaAs Mesfet and Si NMOS ESD Behaviour

D. S. Campbell, E. A. Amerasekera, A. J. Franklin, 1987 .

Capacitive and resistive electronic components: Electrocomponent science monographs volume 8

D. S. Campbell, J. A. Hayes, 1995 .

Stress in thin dielectric films

D. S. Campbell, D. Campbell, 1963 .

Latent damage and parametric drift in electrostatically damaged MOS transistors

Martin J. Tunnicliffe, D. S. Campbell, Vincent M. Dwyer, 1993 .

Electrostatic pulse breakdown in nmos devices

D. S. Campbell, E. A. Amerasekera, 1986 .

Normal force reduction: a variable activation energy process? [electrical contact springs]

D. S. Campbell, N. A. Stennett, D. Campbell, 1994 .

Amorphous PbTiO capacitors

D. S. Campbell, P. J. Harrop, C. J. Ridge, 1968 .

Electrolytic capacitors: their fabrication and the interpretation of their operational behaviour

D. S. Campbell, A. R. Morley, 1973 .

Electrostatic discharge thermal failure in semiconductor devices

D. S. Campbell, Vincent M. Dwyer, A. J. Franklin, 1990 .