Vl. V. Saposhnikov

发表

Self-dual duplication for error detection

Vl. V. Saposhnikov, V. V. Saposhnikov, Alexej Dmitriev, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

A new method for concurrent checking by use of a 1-out-of-4 code

Vl. V. Saposhnikov, V. V. Saposhnikov, Alexej Dmitriev, 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).

New Self-dual Circuits for Error Detection and Testing

Vl. V. Saposhnikov, V. V. Saposhnikov, Alexej Dmitriev, 2000, VLSI Design.

Self-dual parity checking-A new method for on-line testing

Vl. V. Saposhnikov, V. V. Saposhnikov, Alexej Dmitriev, 1996, Proceedings of 14th VLSI Test Symposium.

Modified TMR-system with reduced hardware overhead

Vl. V. Saposhnikov, M. Gossel, V. Ocheretnij, 1999 .

A new method of redundancy addition for circuit optimization

Vl. V. Saposhnikov, V. V. Saposhnikov, Michael Gössel, 2000, Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future.

Design of Fault-Tolerant Circuits by self-dual Duplication

Vl. V. Saposhnikov, M. Gossel, V. V. Saposhnikov, 1998 .

Complementary Circuits for On-Line Detection for 1-out-of-3 Codes

Vl. V. Saposhnikov, V. V. Saposhnikov, Michael Gössel, 2004, ARCS Workshops.

Self-Checking Combinational Circuits with Unidirectionally Independent Outputs

Vl. V. Saposhnikov, V. V. Saposhnikov, Michael Gössel, 1998, VLSI Design.

Necessary and sufficient conditions for the existence of totally self-checking circuits

Vl. V. Saposhnikov, V. V. Saposhnikov, Michael Gössel, 2004, Proceedings. 10th IEEE International On-Line Testing Symposium.

Design of self-checking unidirectional combinational circuits with low area overhead

Vl. V. Saposhnikov, Andrej Morosov, M. Gossel, 1996 .

Experimental Results for Self-Dual Multi-Output Combinational Circuits

Vl. V. Saposhnikov, V. V. Saposhnikov, Michael Gössel, 1999, J. Electron. Test..

A New Design Method for Self-Checking Unidirectional Combinational Circuits

Vl. V. Saposhnikov, V. V. Saposhnikov, Michael Gössel, 1998, J. Electron. Test..

New self-checking circuits by use of Berger-codes

Vl. V. Saposhnikov, V. V. Saposhnikov, Michael Gössel, 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).

The Concurrent Error-Detection Systems Organization Based on the Boolean Complement Method with the Preliminary Transformation of Operating Functions into Check Vectors of Berger Codes

Vl. V. Saposhnikov, V. V. Saposhnikov, D. V. Efanov, 2021 .