Xinghai Tang

The impact of stochastic dopant and interconnect distributions on gigascale integration

J.D. Meindl, A.J. Bhavnagarwala, J.A. Davis, 1997, 1997 IEEE International Solids-State Circuits Conference. Digest of Technical Papers.

Random MOSFET parameter fluctuation limits to gigascale integration (GSI)

Xinghai Tang, J.D. Meindl, V.K. De, 1996, 1996 Symposium on VLSI Technology. Digest of Technical Papers.

Scaling limits of Si MOSFET technology imposed by random parameter fluctuations

Xinghai Tang, J.D. Meindl, V.K. De, 1996, 1996 54th Annual Device Research Conference Digest.