G. Giusi

发表

G. Giusi, O. Giordano, G. Scandurra, 2015, 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings.

G. Giusi, G. Scandurra, C. Ciofi, 2007, SPIE International Symposium on Fluctuations and Noise.

G. Giusi, G. Scandurra, C. Ciofi, 2017, 2017 International Conference on Noise and Fluctuations (ICNF).

G. Giusi, G. Scandurra, C. Ciofi, 2017, 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC).

E. Simoen, C. Claeys, G. Giusi, 2008, 2008 9th International Conference on Ultimate Integration of Silicon.

G. Giusi, F. Crupi, C. Pace, 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

G. Giusi, G. Scandurra, C. Ciofi, 2015, 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings.

G. Giusi, G. Scandurra, C. Ciofi, 2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510).

G. Giusi, G. Scandurra, C. Ciofi, 2017, 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC).

G. Giusi, G. Scandurra, C. Ciofi, 2017, 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC).

G. Giusi, F. Crupi, C. Pace, 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

G. Giusi, G. Scandurra, C. Ciofi, 2013, 2013 22nd International Conference on Noise and Fluctuations (ICNF).

G. Giusi, C. Ciofi, F. Crupi, 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

G. Giusi, C. Ciofi, F. Crupi, 2005, 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings.

G. Giusi, F. Crupi, C. Pace, 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

E. Simoen, G. Giusi, G. Eneman, 2007, IEEE Transactions on Electron Devices.

E. Simoen, C. Claeys, G. Giusi, 2006, IEEE Electron Device Letters.

L. Pantisano, E. Simoen, M. Nafria, 2009, IEEE Transactions on Electron Devices.