Fausto Piazza

High performance Flash memory for 65 nm embedded automotive application

Enrico Gomiero, Sylvie Bruyere, Nicolas Planes, 2010, 2010 IEEE International Memory Workshop.

Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory

Jean Coignus, Fausto Piazza, Francis Balestra, 2017, Microelectron. Reliab..

An I-IP based approach for the monitoring of NBTI effects in SoCs

Paolo Bernardi, C. Guardiani, Davide Appello, 2009, 2009 15th IEEE International On-Line Testing Symposium.