Haiqing Zhou

Reducing CD-SEM measurement carryover effect for 193-nm resist processes using CEq

Chih-Yu Wang, Haiqing Zhou, Aaron Zuo, 2002, SPIE Advanced Lithography.

A study of defect measurement techniques and corresponding effects on the lithographic process window for a 193-nm EPSM photomask

Haiqing Zhou, Trent Hutchinson, William B. Howard, 2003, SPIE Photomask Technology.

Quantification of OPC performance of 150-nm gates using top-down CD-SEM

Chih-Yu Wang, Haiqing Zhou, Craig W. MacNaughton, 2002, SPIE Advanced Lithography.

λ3/20000 plasmonic nanocavities with multispectral ultra-narrowband absorption for high-quality sensing

Haiqing Zhou, Zhengqi Liu, Xiaoshan Liu, 2014 .

Graphitic Carbon Nitride with Dopant Induced Charge Localization for Enhanced Photoreduction of CO2 to CH4

Pengda An, Haiqing Zhou, Xiaoqing Qiu, 2019, Advanced science.

Surface‐Energy Generator of Single‐Walled Carbon Nanotubes and Usage in a Self‐Powered System

Haiqing Zhou, Lijie Qiao, Sishen Xie, 2010, Advanced materials.

Thickness-Dependent Morphologies and Surface-Enhanced Raman Scattering of Ag Deposited on n-Layer Graphenes

Fang Yu, Haiqing Zhou, Lianfeng Sun, 2011 .