Armin Bayer
发表
Armin Bayer,
Frank Barkusky,
Christian Peth,
2006,
SPIE Optics + Photonics.
Kai Cheng,
Robert Mertens,
Piet De Moor,
2009,
Optics + Optoelectronics.
Klaus Mann,
Armin Bayer,
Frank Barkusky,
2008,
Optical Systems Design.
Uwe Leinhos,
Armin Bayer,
Frank Barkusky,
2008,
SPIE LASE.
Klaus Mann,
Armin Bayer,
Frank Barkusky,
2009,
Laser Damage.
Klaus Mann,
Armin Bayer,
Frank Barkusky,
2010,
Advanced Lithography.
Klaus R. Mann,
Armin Bayer,
Frank Barkusky,
2006,
SPIE Advanced Lithography.
Torsten Feigl,
Norbert Kaiser,
Klaus R. Mann,
2005,
SPIE Optical Systems Design.
Armin Bayer,
Frank Barkusky,
Christian Peth,
2008,
SPIE LASE.
Klaus R. Mann,
Armin Bayer,
Frank Barkusky,
2009,
Optics + Optoelectronics.
Armin Bayer,
Frank Barkusky,
Christian Peth,
2007,
SPIE LASE.
Denny Wernham,
Martin Endemann,
Adrian Tighe,
2010,
Laser Damage.
Uwe Leinhos,
Armin Bayer,
Klaus Mann,
2011,
Advanced Lithography.
Klaus R. Mann,
Armin Bayer,
Frank Barkusky,
2007,
SPIE Optics + Optoelectronics.
Klaus R. Mann,
Armin Bayer,
Bernd Schäfer,
2009,
LASE.
Uwe Leinhos,
Armin Bayer,
Klaus Mann,
2008,
SPIE Advanced Lithography.
Denny Wernham,
Federico Pettazzi,
Uwe Leinhos,
2010,
Optical Engineering + Applications.
Klaus Mann,
Armin Bayer,
Frank Barkusky,
2009,
Optics + Optoelectronics.
Armin Bayer,
Frank Barkusky,
Christian Peth,
2007
.
Armin Bayer,
Frank Barkusky,
Christian Peth,
2009
.
Joachim John,
Armin Bayer,
Frank Barkusky,
2009,
The Review of scientific instruments.
Armin Bayer,
Frank Barkusky,
Stefan Döring,
2010,
Optics express.
Vincenzo Antonucci,
Francesco Sergi,
Armin Bayer,
2009,
ECS Transactions.
Armin Bayer,
Bernd Schäfer,
Klaus Mann,
2010,
Optics express.