David P. Vallett

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

Atul Patel, Jason Wright, Phil Nigh, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

An overview of CMOS VLSI failure analysis and the importance of test and diagnostics

David P. Vallett, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

Atul Patel, Jason Wright, Franco Motika, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

IC Failure Analysis: The Importance of Test and Diagnostics

David P. Vallett, 1997, IEEE Des. Test Comput..

Picosecond imaging circuit analysis

David P. Vallett, Jeffrey A. Kash, James C. Tsang, 1998, IBM J. Res. Dev..