Y. H. Lin

High Efficiency Passivated Emitter Rear Contact Solar Cells with Diamond Wire Saw Multi-crystalline Silicon wafers

C. C. Chang, Jung-Wu Chien, F. M. Huang, 2017 .

New Observations on the Uniaxial and Biaxial Strain-Induced Hot Carrier and NBTI Reliabilities for 65nm Node CMOS Devices and Beyond

Y. H. Lin, C. Tsai, S. Chung, 2006, 2006 International Electron Devices Meeting.

The understanding of strain-induced device degradation in advanced MOSFETs with process-induced strain technology of 65nm node and beyond

E. R. Hsieh, Steve S. Chung, Y. H. Lin, 2010, 2010 IEEE International Reliability Physics Symposium.

Cryogen free automated gas chromatography for the measurement of ambient volatile organic compounds.

Y. H. Lin, J. L. Wang, W. L. Chen, 2000, Journal of chromatography. A.