J. Moll

Developing a comprehensive substation cyber security and data management solution

A. Sologar, J. Moll, 2006, 2006 IEEE Power Engineering Society General Meeting.

Specific contact resistivity of TiSi2to P+and n+junctions

J. Moll, J. Moll, J. Hui, 1985, IEEE Electron Device Letters.

A new substrate and gate current phenomenon in short-channel LDD and minimum overlap devices

F.-C. Hsu, J. Moll, F. Hsu, 1985, IEEE Electron Device Letters.

Breakdown mechanism in short-channel MOS transistors

J. Moll, J. Moll, J. Berger, 1978, 1978 International Electron Devices Meeting.

Scaling limitations of submicron local oxidation technology

J. Moll, J. Moll, J. Hui, 1985, 1985 International Electron Devices Meeting.