Anne E. Gattiker
发表
Chung-Lung Kevin Shum,
Charles F. Webb,
Jeffrey A. Zitz,
2014,
IEEE Journal of Solid-State Circuits.
Anne E. Gattiker,
2014,
2014 IEEE 32nd VLSI Test Symposium (VTS).
Sani R. Nassif,
Jacob A. Abraham,
Eun Jung Jang,
2011,
2011 Asian Test Symposium.
Anne E. Gattiker,
2014,
ITC.
Anne E. Gattiker,
2004,
2004 International Conferce on Test.
Inseok Hwang,
Jinho Lee,
Thomas Hubregtsen,
2017,
2017 18th IEEE International Conference on Mobile Data Management (MDM).
Phil Nigh,
Anne E. Gattiker,
2012,
IEEE Des. Test Comput..
Anne E. Gattiker,
2006,
IEEE Des. Test Comput..
Sani R. Nassif,
Jacob A. Abraham,
Eun Jung Jang,
2012,
2012 IEEE 30th VLSI Test Symposium (VTS).
Wojciech Maly,
R. D. Blanton,
Anne E. Gattiker,
2002,
IEEE Des. Test Comput..
Anne E. Gattiker,
2006,
ISPD '06.
Chung-Lung Kevin Shum,
Charles F. Webb,
Pak-kin Mak,
2013,
2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers.
Kush R. Varshney,
Samuel Thomas,
Anne E. Gattiker,
2018,
ArXiv.
Sani R. Nassif,
Cliff C. N. Sze,
William Evan Speight,
2013,
ICCS.
Jinho Lee,
Anne E. Gattiker,
Inseok Hwang,
2019,
IEEE Pervasive Computing.
Sani R. Nassif,
Edward J. Nowak,
Wilfried Haensch,
2006,
2007 IEEE International Electron Devices Meeting.
Sani R. Nassif,
Anne E. Gattiker,
Chris Long,
2002,
2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).
Chintan Patel,
Ernesto Staroswiecki,
Smita Pawar,
2002
.
James F. Plusquellic,
Abhishek Singh,
Chintan Patel,
2003,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Anne E. Gattiker,
2011,
29th VLSI Test Symposium.
Sani R. Nassif,
Jacob A. Abraham,
Eun Jung Jang,
2011,
29th VLSI Test Symposium.
Wojciech Maly,
Anne E. Gattiker,
1997,
Proceedings International Test Conference 1997.
James F. Plusquellic,
Abhishek Singh,
Chintan Patel,
2001,
Proceedings International Test Conference 2001 (Cat. No.01CH37260).
Wojciech Maly,
Anne E. Gattiker,
1998,
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
Anne E. Gattiker,
2010,
2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
Wojciech Maly,
Anne E. Gattiker,
Derek Feltham,
1994,
IEEE Design & Test of Computers.
Wojciech Maly,
Anne E. Gattiker,
1994,
Proceedings., International Test Conference.
Wojciech Maly,
Anne E. Gattiker,
1998,
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
Anne E. Gattiker,
2007,
IEEE Des. Test Comput..
Manjul Bhushan,
Anne E. Gattiker,
Mark B. Ketchen,
2006,
2006 IEEE International Test Conference.
Yong Kim,
Kevin G. Stawiasz,
Keith A. Jenkins,
2015,
IEEE Journal of Solid-State Circuits.
H. Peter Hofstee,
Fadi H. Gebara,
Anne E. Gattiker,
2013,
IBM J. Res. Dev..
Anne E. Gattiker,
2008,
2008 IEEE International Test Conference.
Wojciech Maly,
Thomas M. Storey,
R. D. Blanton,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Wojciech Maly,
Anne E. Gattiker,
A. Gattiker,
1996,
Proceedings of 14th VLSI Test Symposium.
James F. Plusquellic,
Abhishek Singh,
Anne E. Gattiker,
2002,
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).
Phil Nigh,
Anne E. Gattiker,
2000,
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
Anne E. Gattiker,
2008,
2008 IEEE/ACM International Conference on Computer-Aided Design.
Sani R. Nassif,
Duane S. Boning,
Frank Liu,
2002,
TAU '02.
Phil Nigh,
Anne E. Gattiker,
2011,
2011 IEEE International Test Conference.
Phil Nigh,
Anne E. Gattiker,
A. Gattiker,
2004,
2004 International Conferce on Test.
Wojciech Maly,
Anne E. Gattiker,
1997,
J. Electron. Test..
Wojciech Maly,
Anne E. Gattiker,
Michael E. Thomas,
1998
.