文
论文分享
演练场
杂货铺
论文推荐
字
编辑器下载
登录
注册
D. Moyer
发表
Historical trend in alpha-particle induced soft error rates of the Alpha/sup TM/ microprocessor
R. Hokinson, N. Seifert, D. Moyer, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).