J. R. Loo‐Yau

DC or pulse I(V) measurements to simulate transmission line class E power amplifiers

J. A. Reynoso-Hernandez, J. R. Loo‐Yau, H. Ascencio-Ramirez, 2006 .

An alternative method to extract the parasitic capacitances of GaN FETs

J. R. Loo‐Yau, I. Tapia‐Sánchez, P. Moreno, 2015 .

Modeling the I-V characteristics of the power microwave FETs with the Angelov model using pulse measurements

F. I. Hirata-Flores, J. A. Reynoso-Hernandez, J. R. Loo‐Yau, 2006 .