J. De Baets

The electrical performance of a complementary CdSe:In/Ge:Cu thin film transistor technology for flat panel displays

Jan Vanfleteren, Jan Doutreloigne, J. De Baets, 1991 .

Photovia technology : Some important aspects for reliability

Dorina Corlatan, J. De Baets, A. Van Calster, 1999 .

The fabrication and reliability of a photovia test vehicle for MCM-L applications

J. De Baets, A. Van Calster, Koenraad Allaert, 1998 .

Stabilizer Concentration and Local Environment: Their Effects on Electroless Nickel Plating of PCB Micropads

J. De Baets, A. Van Calster, Alfons Vervaet, 1999 .