D.K. Nelson

Boxes: An Engineering Methodology for Calculating Soft Error Rates in SOI Integrated Circuits

D.E. Fulkerson, D.K. Nelson, R.M. Carlson, 2006, IEEE Transactions on Nuclear Science.

150nm SOI embedded SRAMs with very low SER

D.K. Nelson, A. Kohli, H. Liu, 2005, 2005 IEEE International SOI Conference Proceedings.

Modeling Ion-Induced Pulses in Radiation-Hard SOI Integrated Circuits

D.E. Fulkerson, D.K. Nelson, R.M. Carlson, 2007, IEEE Transactions on Nuclear Science.