Atsushi Okamoto

Impacts of Depth and Lateral Profiles of Fluorine Atoms in Gate Oxide Films on Reliability

Shohei Hamada, Tatsushi Yagi, Isao Maru, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

InSb thin films grown on GaAs substrate and their magneto-resistance effect

Ichiro Shibasaki, Atsushi Okamoto, I. Shibasaki, 2001 .

Transport properties of Sn-doped InSb thin films and applications to Hall element

Ichiro Shibasaki, Atsushi Okamoto, I. Shibasaki, 2003 .

Magneto-resistance effect in InSb thin film grown using molecular beam epitaxy

Ichiro Shibasaki, Atsushi Okamoto, I. Shibasaki, 1999 .

Magneto-resistance Effect of Sn-doped InSb Single Crystal Thin Films and Application to Rotation Detection

Kazuhiro Nishimura, Ichiro Shibasaki, Atsushi Okamoto, 2006 .

The Possibility of Train Speed and Position Detection of Magneto-Resistance Elements

Satoshi Yamada, Atsushi Okamoto, Kazuhiro Nishimura, 2007 .