P. Reviriego

发表

M. Alderighi, S. Liu, G. Sorrenti, 2012, IEEE Transactions on Nuclear Science.

P. Reviriego, P. Reyes, J.A. Maestro, 2007, 2007 9th European Conference on Radiation and Its Effects on Components and Systems.

P. Reviriego, J.A. Maestro, O. Ruano, 2008, 2008 IEEE International Symposium on Industrial Electronics.

P. Reviriego, J.A. Maestro, J. A. Maestro, 2009, IEEE Transactions on Device and Materials Reliability.

P. Reviriego, A. Sanchez-Macian, J. A. Maestro, 2012, IEEE Transactions on Device and Materials Reliability.

P. Reviriego, J. A. Maestro, M. Flanagan, 2012, IEEE Transactions on Device and Materials Reliability.

P. Reviriego, J.A. Maestro, J. A. Maestro, 2009, IEEE Transactions on Device and Materials Reliability.

S. Liu, P. Reviriego, S. Lee, 2013, 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).

P. Reviriego, P. Reyes, J.A. Maestro, 2007, 2007 IEEE International Symposium on Industrial Electronics.

P. Reviriego, J. A. Maestro, P. Reviriego, 2015 .

P. Reviriego, P. Reyes, J.A. Maestro, 2007, 2007 IEEE International Symposium on Industrial Electronics.

Sanghyeon Baeg, Soonyoung Lee, P. Reviriego, 2011, IEEE Transactions on Nuclear Science.

P. Reviriego, J. A. Maestro, D. K. Pradhan, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

D. Larrabeiti, L. Bellido, P. Reviriego, 2018, 2018 20th International Conference on Transparent Optical Networks (ICTON).

P. Reviriego, J.A. Maestro, A. Cóbreces, 2017, 2017 6th International Conference on Space Mission Challenges for Information Technology (SMC-IT).

P. Reviriego, J.A. Maestro, O. Ruano, 2008, 2008 IEEE International Symposium on Industrial Electronics.

P. Reviriego, J.A. Maestro, O. Ruano, 2008, IEEE Transactions on Nuclear Science.

P. Reviriego, J.A. Maestro, J. A. Maestro, 2007, IEEE Transactions on Device and Materials Reliability.

Juan Antonio Maestro, P. Reviriego, Shih-Fu Liu, 2012, IEEE Transactions on Device and Materials Reliability.

J. Aracil, D. Larrabeiti, V. Lopez, 2009, Journal of Lightwave Technology.