G. Drenkow

Future test systems architectures

G. Drenkow, 2005, IEEE Instrumentation & Measurement Magazine.

Lan Topologies for Test

G. Drenkow, 2006, 2006 IEEE Autotestcon.

Future test system architectures

G. Drenkow, 2004, Proceedings AUTOTESTCON 2004..

10 YEARS OF DEVELOPMENT BRING COST SAVINGS TO VXI

G. Drenkow, 1998 .

Triggering Differences Between GPIB and LXI

G. Drenkow, 2006, 2006 IEEE Autotestcon.