Chen-Ting Liao

A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams

Henry C. Kapteyn, Margaret M. Murnane, Michael Tanksalvala, 2021, Advanced Lithography.

Multimodal x-ray and electron microscopy of the Allende meteorite

Jianwei Miao, Arjun Rana, Richard Celestre, 2019, Science Advances.