Rob Aitken

Ensuring reliable computation with unreliable devices in the era of AI/ML

Divya Prasad, Rob Aitken, 2021 .

Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging

Asen Asenov, Ben Kaczer, Vikas Chandra, 2016, IEEE Transactions on Electron Devices.

New Defect Behavior at 130 nm and Beyond Emerging Ideas Contribution , Extended

Rob Aitken, 2004 .