G. Cardoso Medeiros

Improving the Detection of Undefined State Faults in FinFET SRAMs

Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil, 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Leticia Bolzani Poehls, 2021, 2021 IEEE European Test Symposium (ETS).