D. Maldonado

Memristor variability and stochastic physical properties modeling from a multivariate time series approach

F.J. Alonso, D. Maldonado, A.M. Aguilera, 2021 .

Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs

Francisco Jimenez-Molinos, Ana M. Aguilera, Juan Bautista Roldán, 2019, Microelectronic Engineering.